Scanning probe microscopy

Results: 577



#Item
511Microscopy / Scanning probe microscopy / Laboratory techniques / Nanolithography / Focused ion beam / Nanotechnology / Atomic force microscopy / Sputtering / Optical microscope / Scientific method / Science / Chemistry

NANO NEWS IS GOOD NEWS” THE NANOWIRE IN THIS ISSUE

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Source URL: www.cns.fas.harvard.edu

Language: English - Date: 2007-01-02 16:27:18
512Chemistry / Science / Capacitor / Energy storage / Work function / Kelvin probe force microscope / Surface science / Condensed matter physics / Physics / Scanning probe microscopy

 +[removed]90 ●  [removed] Application - Hybrid Silicon-Organic Devices “Electrochemical Characterization of Si(111) Modified with Linear and Branched Alkyl Chains” Abstract: A simple chemical

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Source URL: www.xtronix.ch

Language: English - Date: 2014-01-14 14:43:15
513Electron microscope / Transmission electron microscopy / Microscopy / Microscope / Electron diffraction / Tomography / Atom probe / Focused ion beam / Environmental scanning electron microscope / Scientific method / Electron microscopy / Science

Microscopy Society of America DVD Library Number #1 Title/Presenter The Transmission Electron Microscope 29 minutes/ B&W

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Source URL: www.microscopy.org

Language: English - Date: 2012-07-06 09:52:16
514Scanning probe microscopy / Spectroscopy / Intermolecular forces / Atomic force microscopy / Chemical imaging / Infrared spectroscopy / Microscopy / Infrared / Polythiophene / Chemistry / Scientific method / Science

VOL. 26 NO[removed]ARTICLE

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Source URL: www.spectroscopyeurope.com

Language: English - Date: 2014-02-14 11:56:43
515Semiconductor device fabrication / Electron beam / Scanning probe microscopy / Failure analysis / Maintenance / Electron beam induced current / Focused ion beam / Scanning electron microscope / MIL-STD-883 / Scientific method / Science / Electron microscopy

SERVICES OVERVIEW ISO 9001, AS 9100, DLA MIL-PRF-38535, MIL-STD-883, ITAR registered and a DMEA Trusted

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Source URL: www.integra-tech.com

Language: English - Date: 2013-11-25 02:57:33
516Chemistry / Nanotechnology / Microscopes / Intermolecular forces / Microscopy / Scanning tunneling microscope / Atomic force microscopy / AFM probe / Nanoindentation / Scanning probe microscopy / Science / Scientific method

Controlled AFM manipulation of small nanoparticles and assembly of hybrid nanostructures

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Source URL: www.ph.utexas.edu

Language: English - Date: 2012-08-09 21:12:04
517Technology / Materials science / Microscopy / Intermolecular forces / Scanning probe microscopy / Carbon nanotube / Atomic force microscopy / AFM probe / Nanosensors / Nanotechnology / Emerging technologies / Science

Carbon Nanotube Atomic Force Microscope Tip Brian Ruby, Carbon Nanoprobes, Inc., State College, PA.

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Source URL: www.mri.psu.edu

Language: English - Date: 2010-08-25 15:48:57
518Atomic force microscopy / Scanning tunneling microscope / Chemistry / Scanning probe microscopy / Scientific method / Science

The role of surface corrugation and tip oscillation in single-molecule manipulation with a non-contact atomic force microscope

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Source URL: www.ncbi.nlm.nih.gov

Language: English
519Chemistry / Raman microscope / Scientific method / Transmission Raman spectroscopy / Vibrational analysis with scanning probe microscopy / Spectroscopy / Raman spectroscopy / Physics

Clinical superficial Raman probe aimed for epithelial tumor detection: Phantom model results Michelle Agenant,1,2,* Matthijs Grimbergen,1 Ronald Draga,2 Eric Marple,3 Ruud Bosch,2 and Christiaan van Swol1 1

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Source URL: www.ncbi.nlm.nih.gov

Language: English
520Scientific method / Atomic force microscopy / Kelvin probe force microscope / Scanning tunneling microscope / Microscopy / Microscope / Characterization / Optical microscope / Nanotechnology / Scanning probe microscopy / Science / Chemistry

Noncontact atomic force microscopy II Mehmet Z. Baykara*1 and Udo D. Schwarz*2

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Source URL: www.ncbi.nlm.nih.gov

Language: English
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